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Mechanism of the reverse gate leakage in AlGaN/GaN high electron mobility transistors

✍ Scribed by Karmalkar, Shreepad; Sathaiya, D. Mahaveer; Shur, M. S.


Book ID
127223653
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
236 KB
Volume
82
Category
Article
ISSN
0003-6951

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