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Measurement of liquid crystal film thickness using interferometry

✍ Scribed by Kossivas, F; Kyprianou, A


Book ID
120381127
Publisher
Institute of Physics
Year
2010
Tongue
English
Weight
727 KB
Volume
21
Category
Article
ISSN
0957-0233

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Measurement of thin film thickness by el
✍ Canan KaraaliogΜƒlu; Yani Skarlatos πŸ“‚ Article πŸ“… 2004 πŸ› Elsevier Science 🌐 English βš– 362 KB

The surface profile of an Al thin film and its thickness have been observed by electronic speckle pattern interferometry (ESPI). The Michelson interferometer was used as our basic interferometric system to obtain interference fringes on a CCD camera. These interference fringes, arising from the path