✦ LIBER ✦

The Measurement of Thin Film Thickness by Interferometry

✍ Scribed by TOLANSKY, S.

Book ID: 115377436
Publisher: Optical Society of America
Year: 1951
Weight: 717 KB
Volume: 41
Category: Article
ISSN: 0030-3941
DOI: 10.1364/JOSA.41.000425

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