✦ LIBER ✦

Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

✍ Scribed by Kim, Seung-Woo ;Kim, Gee-Hong

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thin-film thickness profile and its refr

✍ Ghim, Young-Sik; Kim, Seung-Woo 📂 Article 📅 2006 🏛 Optical Society of America 🌐 English ⚖ 466 KB

Thin-film thickness profile measurement

✍ Young-Min Hwang; Sung-Won Yoon; Jung-Hwan Kim; Souk Kim; Heui-Jae Pahk 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 855 KB

The Measurement of Thin Film Thickness b

✍ TOLANSKY, S. 📂 Article 📅 1951 🏛 Optical Society of America ⚖ 717 KB

Spectrally resolved white–light phase–sh

✍ Debnath, Sanjit K.; Kothiyal, Mahendra P.; Schmit, Joanna; Hariharan, Parameswar 📂 Article 📅 2006 🏛 Optical Society of America 🌐 English ⚖ 101 KB

Scanning white-light interferometer for

✍ Sun, Changsen ;Yu, Longcheng ;Sun, Yuxing ;Yu, Qingxu 📂 Article 📅 2005 🏛 The Optical Society 🌐 English ⚖ 257 KB

Thickness of SiO2thin film on silicon wa

✍ P. Hlubina; D. Ciprian; J. Luňáček; M. Lesňák 📂 Article 📅 2006 🏛 Springer 🌐 English ⚖ 271 KB