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Fourier transform method for measurement of thin film thickness by speckle interferometry

✍ Scribed by Karaaliog̃lu, Canan; Skarlatos, Yani

Book ID: 115483638
Publisher: The International Society for Optical Engineering
Year: 2003
Tongue: English
Weight: 465 KB
Volume: 42
Category: Article
ISSN: 0091-3286
DOI: 10.1117/1.1572498

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