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Measurement of liquid-film thickness by laser interferometry

✍ Scribed by Nozhat, Wali M.

Book ID
115346540
Publisher
The Optical Society
Year
1997
Tongue
English
Weight
785 KB
Volume
36
Category
Article
ISSN
1559-128X

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The surface profile of an Al thin film and its thickness have been observed by electronic speckle pattern interferometry (ESPI). The Michelson interferometer was used as our basic interferometric system to obtain interference fringes on a CCD camera. These interference fringes, arising from the path