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Substrate Damage in Film Thickness Measurement by Beam Interferometry

✍ Scribed by SCOTT, G. DAVID

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

110. Substrate damage in film thickness

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✍ WEAVER, C.; BENJAMIN, P. 📂 Article 📅 1958 🏛 Nature Publishing Group 🌐 English ⚖ 197 KB

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The Measurement of Thin Film Thickness b

✍ TOLANSKY, S. 📂 Article 📅 1951 🏛 Optical Society of America ⚖ 717 KB

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✍ Nozhat, Wali M. 📂 Article 📅 1997 🏛 The Optical Society 🌐 English ⚖ 785 KB