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Mapping of multiple-quantum-well layers and structure of V defects in InGaN/GaN diodes

✍ Scribed by Saijo, H.; Hsu, J. T.; Tu, R. C.; Yamada, M.; Nakagawa, M.; Yang, J. R.; Shiojiri, M.

Book ID: 127393218
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 434 KB
Volume: 84
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1689740

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