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Electron microscopy investigations of V defects in multiple InGaN/GaN quantum wells and InGaN quantum dots

✍ Scribed by J.R. YANG; W.C. LI; H.L. TSAI; J.T. HSU; M. SHIOJIRI

Book ID: 108866708
Publisher: John Wiley and Sons
Year: 2010
Tongue: English
Weight: 460 KB
Volume: 237
Category: Article
ISSN: 0022-2720
DOI: 10.1111/j.1365-2818.2009.03242.x

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