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Low overhead design-for-testability for scan-based delay fault testing

✍ Scribed by YANG, D; CHEN, G; XIE, Y

Book ID: 122140003
Publisher: Elsevier Science
Year: 2007
Weight: 359 KB
Volume: 18
Category: Article
ISSN: 1004-4132
DOI: 10.1016/S1004-4132(07)60047-4

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