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A low overhead design for testability and test generation technique for core-based systems-on-a-chip

✍ Scribed by Ghosh, I.; Jha, N.K.; Dey, S.

Book ID: 119778559
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 347 KB
Volume: 18
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.806811

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