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A fast and low-cost testing technique for core-based system-chips

✍ Scribed by Ghosh, I.; Dey, S.; Jha, N.K.

Book ID: 119778646
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 313 KB
Volume: 19
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.856974

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