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Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips

✍ Scribed by Wang, W.-C.; Hsu, C.-Y.; Li, J.; Sung, Y.-C.; Rao, A.; Wang, L.-T.


Book ID
117809924
Publisher
The Institution of Engineering and Technology
Year
2011
Tongue
English
Weight
669 KB
Volume
5
Category
Article
ISSN
1751-8601

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