Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores

✍ Scribed by Tomokazu Yoneda; Hideo Fujiwara

• Book ID: 110349723
• Publisher: Springer US
• Year: 2002
• Tongue: English
• Weight: 450 KB
• Volume: 18
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/a:1016553809732