✦ LIBER ✦
Design for electron beam testability: On-chip generation of periodic test sequences in a scan path environment
✍ Scribed by Josef Groβ; Torsten Grüning
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 873 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0167-9317
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