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Design-for-testability for path delay faults in large combinational circuits using test points

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 119778320
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 269 KB
Volume: 17
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.703823

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