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Low-Frequency-Noise Spectroscopy of SIMOX and Bonded SOI Wafers

✍ Scribed by Kushner, V.A.; Park, K.; Schroder, D.K.; Thornton, T.J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Experimental investigation and numerical

✍ Jomaah, J. ;Balestra, F. ;Ghibaudo, G. 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 265 KB

Comparative study of low frequency noise

✍ Sang-Sik Choi; A-Ram Choi; Jeon-Wook Yang; Yong-Woo Hwang; Deok Ho Cho; Kyu-Hwan 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 483 KB

Determination of the parameters of deep

✍ T. A. Kholomina 📂 Article 📅 1998 🏛 Springer US 🌐 English ⚖ 395 KB

[IEEE 1994 IEEE International SOI Confer

✍ Masui, S.; Nakajima, T.; Kawamura, K.; Yano, T.; Hamaguchi, I.; Kajiyama, K.; Ta 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 207 KB

[IEEE 2010 IEEE Bipolar/BiCMOS Circuits

✍ Cheng, Peng; Horst, Stephen; Phillips, Stanley; Seth, Sachin; Mills, Richie; Cre 📂 Article 📅 2010 🏛 IEEE ⚖ 281 KB

Qualifying of chip bonding operations in

📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 133 KB