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[IEEE 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Austin, TX, USA (2010.10.4-2010.10.6)] 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - An investigation of low-frequency noise in complementary SiGe HBTs on SOI

✍ Scribed by Cheng, Peng; Horst, Stephen; Phillips, Stanley; Seth, Sachin; Mills, Richie; Cressler, John D.; Cestra, Greg; Krakowski, Tracey; Babcock, Jeff A.; Buchholz, Alan

Book ID: 115445835
Publisher: IEEE
Year: 2010
Weight: 281 KB
Volume: 0
Category: Article
ISBN: 1424485789
DOI: 10.1109/bipol.2010.5667937

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