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Qualifying of chip bonding operations in the process of fabrication of bipolar transistors by means of noise measurements in the low-frequency range : Boguslaw Grzybowski, Alicja Konczakowska and Ludwik Spiralski. Electron Technol. 20(3/4), 17 (1987)


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
133 KB
Volume
31
Category
Article
ISSN
0026-2714

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