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Determination of the parameters of deep levels in semiconductors using nonstationary spectroscopy and low-frequency noise spectroscopy

✍ Scribed by T. A. Kholomina

Publisher: Springer US
Year: 1998
Tongue: English
Weight: 395 KB
Volume: 41
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf02503838

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