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Express methods of determining the parameters of deep centers in semiconductors from the data of nonsteady capacitive spectroscopy

✍ Scribed by V. A. Ivanyukovich; T. I. Kol'chenko; V. M. Lomako

Publisher: Springer US
Year: 1985
Tongue: English
Weight: 339 KB
Volume: 43
Category: Article
ISSN: 0021-9037
DOI: 10.1007/bf00662383

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