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On the determination of the defect parameters of repulsive centers by deep level transient spectroscopy

✍ Scribed by G. Huylebroeck; P. Clauws; J. Vennik

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 472 KB
Volume: 33
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(90)90243-8

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