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Investigation of the CaF2/p-type Si(100) interface by conductance and deep level transient spectroscopy

✍ Scribed by G. Couturier; H. Ricard; A. Thabti; A.S. Barrière; H. Ishiwara


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
628 KB
Volume
34
Category
Article
ISSN
0038-1101

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