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Comparative analysis of reflection and surface polariton spectroscopies as methods for the determination of intrinsic plasma frequencies in semiconductors

✍ Scribed by E. F. Venger; A. V. Goncharenko; Yu. A. Pasechnik; A. V. Mel'nichuk


Publisher
Springer US
Year
1992
Tongue
English
Weight
386 KB
Volume
56
Category
Article
ISSN
0021-9037

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