✦ LIBER ✦
Comparative study of low frequency noise and hot-carrier reliability in SiGe PD SOI pMOSFETs
✍ Scribed by Sang-Sik Choi; A-Ram Choi; Jeon-Wook Yang; Yong-Woo Hwang; Deok Ho Cho; Kyu-Hwan Shim
- Book ID
- 108060536
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 483 KB
- Volume
- 254
- Category
- Article
- ISSN
- 0169-4332
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