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Low frequency noise in biaxially strained silicon n-MOSFETs with ultrathin gate oxides

✍ Scribed by Thierry Contaret; Touati Boutchacha; Gérard Ghibaudo; Frédéric Bœuf; Thomas Skotnicki


Book ID
108271567
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
599 KB
Volume
51
Category
Article
ISSN
0038-1101

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