✦ LIBER ✦
Impact of strain and source/drain engineering on the low frequency noise behaviour in n-channel tri-gate FinFETs
✍ Scribed by W. Guo; B. Cretu; J.-M. Routoure; R. Carin; E. Simoen; A. Mercha; N. Collaert; S. Put; C. Claeys
- Book ID
- 108271693
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 766 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0038-1101
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