Slow oxide trap density profile extraction using gate current low-frequency noise in ultrathin oxide MOSFETs

✍ Scribed by J. Armand; F. Martinez; M. Valenza; K. Rochereau; E. Vincent

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 355 KB
• Volume: 84
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2007.04.099