✦ LIBER ✦
Gate-length dependence of the low-frequency noise overshoot in partially depleted SOI n-MOSFET's
✍ Scribed by E. Simoen; C. Claeys
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 186 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0038-1098
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