✦ LIBER ✦
High gate voltage drain current leveling off and its low-frequency noise in 65 nm fully-depleted strained and non-strained SOI nMOSFETs
✍ Scribed by N. Lukyanchikova; N. Garbar; V. Kudina; A. Smolanka; M. Lokshin; E. Simoen; C. Claeys
- Book ID
- 108271643
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 248 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0038-1101
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