✦ LIBER ✦

Low-Cost Scan Test for IEEE-1500-Based SoC

✍ Scribed by Hyunbean Yi; Jaehoon Song; Sungju Park

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Low-Cost Self-Test Techniques for Small

✍ Huang, Y.-J.; Li, J.-F. 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 434 KB

IEEE Std 1500 enables core-based SoC tes

📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 60 KB

On-Chip SOC Test Platform Design Based o

✍ Kuen-Jong Lee; Tong-Yu Hsieh; Ching-Yao Chang; Yu-Ting Hong; Wen-Cheng Huang 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 494 KB

Low-cost modular testing and test resour

✍ Chakrabarty, K. 📂 Article 📅 2005 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 531 KB

Low-power selective pattern compression

✍ Sivanantham, S.; Mallick, P.S.; Raja Paul Perinbam, J. 📂 Article 📅 2014 🏛 Elsevier Science 🌐 English ⚖ 938 KB

A New Scan Architecture for Both Low Pow

✍ Hong-Sik Kim; Sungho Kang; Michael S. Hsiao 📂 Article 📅 2008 🏛 Springer US 🌐 English ⚖ 490 KB