✦ LIBER ✦

Low-cost modular testing and test resource partitioning for SOCs

✍ Scribed by Chakrabarty, K.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Low-Cost Scan Test for IEEE-1500-Based S

✍ Hyunbean Yi; Jaehoon Song; Sungju Park 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 951 KB

On the identification of modular test re

✍ Yiorgos Makris; Alex Orailoglu 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 248 KB

Low-Cost Self-Test Techniques for Small

✍ Huang, Y.-J.; Li, J.-F. 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 434 KB

LI-BIST: A Low-Cost Self-Test Scheme for

✍ Krishna Sekar; Sujit Dey 📂 Article 📅 2003 🏛 Springer US 🌐 English ⚖ 660 KB

Simultaneous allocation of testing time

✍ P. K. Kapur; Anu G. Aggarwal; Gurjeet Kaur 📂 Article 📅 2010 🏛 Springer-Verlag 🌐 English ⚖ 932 KB

Area-time associated test cost model for

✍ Jin-yi Zhang; Han-yi Weng; Xu-hui Huang; Wan-lin Cai 📂 Article 📅 2011 🏛 Chinese Electronic Periodical Services 🌐 English ⚖ 409 KB