✦ LIBER ✦
Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers
✍ Scribed by Huang, Y.-J.; Li, J.-F.
- Book ID
- 115495840
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 434 KB
- Volume
- 20
- Category
- Article
- ISSN
- 1063-8210
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