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IEEE Std 1500 enables core-based SoC test development

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📜 SIMILAR VOLUMES

IEEE Std 1500 Enables Modular SoC Testin

✍ Marinissen, E.J.; Zorian, Y. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 563 KB

Low-Cost Scan Test for IEEE-1500-Based S

✍ Hyunbean Yi; Jaehoon Song; Sungju Park 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 951 KB

On-Chip SOC Test Platform Design Based o

✍ Kuen-Jong Lee; Tong-Yu Hsieh; Ching-Yao Chang; Yu-Ting Hong; Wen-Cheng Huang 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 494 KB

[IEEE Tenth Asian Test Symposium - Kyoto

✍ Yu Huang, ; Wu-Tung Cheng, ; Chien-Chung Tsai, ; Mukherjee, N.; Samman, O.; Zaid 📂 Article 📅 2001 🏛 IEEE ⚖ 565 KB

[IEEE 2013 18th IEEE European Test Sympo

✍ Deutsch, Sergej; Chakrabarty, Krishnendu 📂 Article 📅 2013 🏛 IEEE ⚖ 276 KB

[IEEE Comput. Soc . Design, Automation a

✍ Brunel, J.-Y.; Di Natale, M.; Ferrari, A.; Giusto, P.; Lavagno, L. 📂 Article 📅 2004 🏛 IEEE Comput. Soc 🌐 English ⚖ 263 KB