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On-Chip SOC Test Platform Design Based on IEEE 1500 Standard

✍ Scribed by Kuen-Jong Lee; Tong-Yu Hsieh; Ching-Yao Chang; Yu-Ting Hong; Wen-Cheng Huang

Book ID: 118161113
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 494 KB
Volume: 18
Category: Article
ISSN: 1063-8210
DOI: 10.1109/tvlsi.2009.2019978

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