✦ LIBER ✦
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment
✍ Scribed by Hong-Sik Kim; Sungho Kang; Michael S. Hsiao
- Publisher
- Springer US
- Year
- 2008
- Tongue
- English
- Weight
- 490 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0923-8174
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