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[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - Full integration and reliability evaluation of phase-change RAM based on 0.24 μm-CMOS technologies

✍ Scribed by Hwang, Y.N.; Hong, J.S.; Lee, S.H.; Ahn, S.J.; Jeong, G.T.; Koh, G.H.; Oh, J.H.; Kim, H.J.; Jeong, W.C.; Lee, S.Y.; Park, J.H.; Ryoo, K.C.; Horii, H.; Ha, Y.H.; Yi, J.H.; Cho, W.Y.; Kim, Y.T.; Lee, K.H.; Joo, S.H.; Park, S.O.; Chung, U.I.; Jeong, H.S.; Kinam Kim,

Book ID: 126702000
Publisher: Japan Soc. Applied Phys
Year: 2003
Weight: 231 KB
Category: Article
ISBN-13: 9784891140335
DOI: 10.1109/VLSIT.2003.1221141

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