✦ LIBER ✦

[Japan Soc. Applied Phys 2003 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (10-12 June 2003)] 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - Energy distribution of interface traps in high-k gated MOSFETs

✍ Scribed by Han, J.-P.; Vogel, E.M.; Gusev, E.P.; D'Emic, C.; Richter, C.A.; Heh, D.W.; Suehle, J.S.

No coin nor oath required. For personal study only.

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