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Investigation of stress-induced defects in shallow trench isolation by cathodoluminescence and Raman spectroscopies

✍ Scribed by Sugie, R.; Matsuda, K.; Ajioka, T.; Yoshikawa, M.; Mizukoshi, T.; Shibusawa, K.; Yo, S.


Book ID
121086028
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
666 KB
Volume
100
Category
Article
ISSN
0021-8979

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