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Defect-induced structural disorder in tetragonal Cu(In1 xGax)5Se8 thin films investigated by Raman spectroscopy: the effect of Ga addition

✍ Scribed by Xu, Chuan-Ming; Huang, Wen-Hao; Xu, Jun; Yang, Xiao-Jie; Zuo, Jian; Xu, Xiao-Liang; Liu, Hong-Tu


Book ID
115506401
Publisher
Institute of Physics
Year
2004
Tongue
English
Weight
210 KB
Volume
16
Category
Article
ISSN
0953-8984

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