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Investigation of nanostructure properties in InGaN/GaN multiple quantum wells by X-ray diffraction analysis

✍ Scribed by Jiunn-Chyi Lee

Book ID: 113914177
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 415 KB
Volume: 13
Category: Article
ISSN: 1293-2558
DOI: 10.1016/j.solidstatesciences.2011.01.029

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