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Evaluation of strain and In content in (InGaN/GaN) multiquantum wells by x-ray analysis

✍ Scribed by Krost, A.; Bläsing, J.; Lünenbürger, M.; Protzmann, H.; Heuken, M.

Book ID: 126278865
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 400 KB
Volume: 75
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.124483

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