Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping

✍ Scribed by Pereira, S.; Correia, M. R.; Pereira, E.; O’Donnell, K. P.; Alves, E.; Sequeira, A. D.; Franco, N.; Watson, I. M.; Deatcher, C. J.

• Book ID: 120373963
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 444 KB
• Volume: 80
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1481786