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Determination of the indium content and layer thicknesses in InGaN/GaN quantum wells by x-ray scattering

✍ Scribed by Vickers, M. E.; Kappers, M. J.; Smeeton, T. M.; Thrush, E. J.; Barnard, J. S.; Humphreys, C. J.

No coin nor oath required. For personal study only.

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