Determination of critical layer thickness and strain tensor in InxGa1-xAs/GaAs quantum‐well structures by x‐ray diffraction

✍ Scribed by Chen, Y. C.; Bhattacharya, P. K.

• Book ID: 118030913
• Publisher: American Institute of Physics
• Year: 1993
• Tongue: English
• Weight: 983 KB
• Volume: 73
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.354030