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Characterization of InxGa1−xAs/GaAs strained layer superlattices by ion backscattering-channeling and X-ray diffraction

✍ Scribed by Flagmeyer, R. ;Lenkeit, K. ;Baumbach, T. ;Kanter, Yu. O. ;Fedorov, A. A.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
272 KB
Volume
107
Category
Article
ISSN
0031-8965

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