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Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices

✍ Scribed by X.F. Duan; K.K. Fung

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 728 KB
Volume: 36
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(91)90129-t

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