✦ LIBER ✦
Precise thickness measurement within a few monolayers by X-ray diffraction from InGaAs/GaAs strained-layer superlattices
✍ Scribed by M. Sato; T. Kawaguchi; S. Nishi
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 375 KB
- Volume
- 150
- Category
- Article
- ISSN
- 0022-0248
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