Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

✍ Scribed by X.F. Duan; K.K. Fung; Y.M. Chu

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 479 KB
• Volume: 141
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(94)90099-x