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Characterization of long-periodic layered structures by X-ray diffraction IV: Small angle X-ray diffraction from a superlattice with non-ideal interfaces

✍ Scribed by Yuji Sasanuma; Mamoru Uchida; Kazuyuki Okada; Katsuhiko Yamamoto; Yukishige Kitano; Akira Ishitani

No coin nor oath required. For personal study only.

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